Influence of the Interorbital Interference on the Electron Tunneling in Scanning Tunneling Microscopy

Secondary Electron Trajectories in Scanning Tunneling Microscopy

The recently developed technique Scanning Tunneling Microscopy in the Field Emission regime (STM FE) is based on the Russell Young's topografiner technology [1]. The set-up is a no contacting device consisting of a sharp tip approached vertically to a conducting surface at variable distances and biased with a small voltage with respect to the surface (Figure 1). The system builds a junction acr...

Microscopy, Scanning Tunneling

Ultrafast Scanning Tunneling Microscopy

Scanning Tunneling Microscopy

The invention of the scanning tunneling microscope was a singularity event in the field of surface science and condensed matter physics. The ability to visualize individual atoms in an atomic structure was a huge step forward in experimental development, one for which the inventors were awarded the Nobel Prize in Physics in 1986. While a groundbreaking development, the Scanning Tunneling Micros...

Scanning tunneling microscopy

This paper begins with a brief introduction the development of scanning tunneling microscopy (STM); in the second part, we will present some basic theory about STM, we will pay more attention on the theory for tunneling between the surfaces of the sample with the model probe tip. Next, we introduce the STM facility, include different modes of operation and other influence factors. In addition, ...